IEC 60950-1 Fig NAF.2(S5366) Wedge Probe For Testing Document Shredders

Product details:
 

The wedge probe is a new accessibility probe required by the standard of IEC 60950-1 Fig NAF.2(S5366) and NAF.3(S5370) as well as BS 60950.1108/260/CD for paper shredders. It is used to test whether the hazardous parts of shredder can be touched by people.

The probe is electrically conductive as required in the standard. Also there is a threaded connector in the handle to accept either a force gauge or a banana plug wire connection.